SEER Lab’s Prof. Jeremy Bradbury and Riddhi More are at the 18th IEEE International Conference on Software Testing, Verification and Validation (ICST 2025) this week in Naples, Italy. Riddhi will be presented their paper “An Analysis of LLM Fine-Tuning and Few-Shot Learning for Flaky Test Detection and Classification” and Prof. Jeremy Bradbury will be presentingContinue reading “SEER Lab at ICST 2025!”